yield-analysis

A d3.js wafer map in a react component

Interactive wafer map visualization and yield analysis for semiconductor test data. Rendering, spatial statistics, failure clustering, lot-level trends, and reticle analysis — pure ES modules, no dependencies.

Have an LLM (LangGraph agent) control QuantLib, the cache, your databases and any plug-in tools. Includes evaluator framework and an Excel/LibreOffice API in https://github.com/FulgentMcGuffin/cqfi-xl and makes use of https://github.com/FulgentMcGuffin/mcp_data

📊 A Power BI project that analyzes agricultural productivity across Indian states using rainfall, fertilizer usage, pesticide application, and yield data. The interactive dashboard allows users to explore crop-wise and state-wise performance, identify key influencers, and derive actionable insights for improving agricultural outcomes.

Desktop and browser wafer map viewer for semiconductor test data — Tauri v2, Rust/WASM parsers for STDF/ATDF/CSV/JSON/Parquet, wafermap rendering

Municipal bond anomaly detector — flags small munis (<$20M) paying 50+ bps above peer average

Semiconductor equipment process monitoring and yield analysis portfolio using simulated CVD batch data.

Cambi Protocol's Cross-Collateral Yield Optimization Engine

Most associations in this public semiconductor dataset are artifacts of time. 32 features clear BH-FDR with permutation p=0.0005, but only 2 survive a change of time period. Chronological split, DuckDB/SQL warehouse, SPC, cost-aware baseline, every transform fitted on train only.

Pro Tic Tac - Semiconductor Machine Learning & AI Analytics Showcase Platform

Physics-based Monte Carlo yield analysis and design optimisation tool for MZI optical switches in silicon photonics. Validated against published fab data.

Wafer inspection and yield analytics for semiconductor fabs. Immutable measurement history, per-defect-code normalisation for lot/tool/step Pareto drill-down, CQRS over PostgreSQL. .NET 8, EF Core + Dapper, Redis, Prometheus.

Semantic risk layer for DeFi yield, powered by GenLayer consensus.

NAND validation analytics dashboard for yield review, firmware comparison, outlier detection, and release-readiness gating.

JMP-based lithography focus-dose process window and yield analysis using public exposure and inspection data.

BOM-aware defect correlation with automated root-cause ranking for semiconductor yield: SAP/Teamcenter BOM graphs, supplier lot ranking. scikit-learn · networkx · Snowflake · dbt. Root cause in 34 sec vs 2–3 days.

Yield Analytics

Automated root-cause analysis pipeline for semiconductor yield excursions using Random Forest classification.

Wafer defect pattern classification on WM-811K: engineered spatial features vs CNN, with explainability and automated excursion reporting

EFA-aware wafer map failure pattern classification on WM-811K — calibrated confidence, selective prediction, honest evaluation